TechConnect Briefs
  • Briefs Home
  • Volumes
  • About
    • TechConnect Briefs
    • Submissions
    • Editors
  • TechConnect
HomeKeywordstransmission electron microscopy

Keywords: transmission electron microscopy

AuxAg1-x alloy seeds: A way to control growth, morphology and defect formation in Ge nanowiress

Biswas S., Holmes J.D., University College Cork, IE
Ge nanowires are of current interest for high speed nanoelectronic devices due to the lower band gap and high carrier mobility and larger excitonic Bohr radius of Ge yields a more pronounced quantum confinement effect.Most [...]

Deposition and Characterization of Platinum Nanoparticles on Highly Orientated Pyrolytic Graphite

Elizondo-Villarreal N., Novar C., Zhou J.P., Alvarez Contreras L., Tel Vered R., Universidad Autonoma de Nuevo Leon, MX
Platinum is considered one of the best electrocatalyst for low temperature reactions in a H2/O2 fuel cell. Metallic nanoparticles are of great interest because of the modification of properties observed due to size effects, modifying [...]

Deposition and Characterization of Platinum Nanoparticles on Highly Orientated Pyrolytic Graphite

Elizondo-Villarreal N., Novar C., Zhou J.P., Alvarez Contreras L., Tel Vered R., Universidad Autonoma de Nuevo Leon, MX
Platinum is considered one of the best electrocatalyst for low temperature reactions in a H2/O2 fuel cell. Metallic nanoparticles are of great interest because of the modification of properties observed due to size effects, modifying [...]

Tracking the Formation of a Break Junction Formed by Electromigration using Transmission Electron Microscopy

Dong J., Parviz B.A., University of Washington, US
Break junctions formed by electromigration have been extensively used in the molecular electronics and electrical characterization of atomic or molecular clusters and biological molecules such as deoxyribonucleic acid (DNA)1. However, to obtain a controllable gap [...]

Lattice Fringe Fingerprinting in Two Dimensions with Database Support

Moeck P., Seipel B., Bjorge R., Fraundorf P., Portland State University, US
Direct space high-resolution phase-contrast transmission electron microscopy (HRTEM) and atomic resolution Z-contrast scanning TEM (Z-STEM), when combined with tools for image-based nanocrystallography possess the capacity to derive the crystallographic phase and shape of nanocrystals. This [...]

About TechConnect Briefs

TechConnect Briefs is an open access journal featuring over 10,000 applications-focused research papers, published by TechConnect and aligned with over 20 years of discovery from the annual Nanotech and the TechConnect World Innovation Conferences.

Full Text Search

TechConnect World

June 17-19, 2024 • Washington, DC

TechConnect Online Community

» Free subscription!

Topics

3D Printing Advanced Manufacturing Advanced Materials for Engineering Applications AI Innovations Biofuels & Bioproducts Biomaterials Cancer Nanotechnology Carbon Capture & Utilization Carbon Nano Structures & Devices Catalysis Chemical, Physical & Bio-Sensors Coatings, Surfaces & Membranes Compact Modeling Composite Materials Diagnostics & Bioimaging Energy Storage Environmental Health & Safety of Nanomaterials Fuel cells & Hydrogen Graphene & 2D-Materials Informatics, Modeling & Simulation Inkjet Design, Materials & Fabrication Materials Characterization & Imaging Materials for Drug & Gene Delivery Materials for Oil & Gas Materials for Sustainable Building MEMS & NEMS Devices, Modeling & Applications Micro & Bio Fluidics, Lab-on-Chip Modeling & Simulation of Microsystems Nano & Microfibrillated Cellulose Nanoelectronics Nanoparticle Synthesis & Applications Personal & Home Care, Food & Agriculture Photonic Materials & Devices Printed & Flexible Electronics Sensors - Chemical, Physical & Bio Solar Technologies Sustainable Materials Water Technologies WCM - Compact Modeling
  • Sitemap
  • Contact

Copyright © TechConnect a Division of ATI | All rights reserved.