tools – TechConnect Briefs

Learning from an Informatics Approach Applied to Materials Design

Poleski J., Krein M., Barto R., Lockheed Martin, US

Nanomaterials will significantly impact commercial and military applications when context and understanding of their vast design and property space is achieved. Identifying the design parameters of important materials is one of the first steps in [...]

Atomic scale dopant detection in an individual silicon nanowire by atom probe tomography

Chen W-H, Lardé R., Cadel E., Xu T., Grandidier B., Nys J.P., Pareige P., Groupe de Physique des Matériaux, FR

The atom probe tomography is a three-dimensional high resolution analytical microscope that can map the distribution of atoms in semiconductor materials such as silicon nanowires.

Assessment of the Impacts of Packaging, Long-Term Storage, and Transportation on the Military MEMS

Zunino III J.L., Skelton D.R., US Army ARDEC, US

The Army is transforming into a more lethal, lighter and agile force. Enabling technologies that support this transition must decrease in size while increasing in intelligence. Micro-electromechanical systems (MEMS) are one such technology that the [...]