tip – TechConnect Briefs

Platinum Silicide probes: A novel approach to manufacture highly conductive AFM probes with small radii and high wear resistance

Krause O., Sebastian A., Despont M., Nanoworld Services, DE

Conventionally, conductive Atomic Force Microscopy (c-AFM) probes are either made by depositing a metal, an alloy or a doped diamond layer onto a ready-made AFM probe or, alternatively, by depositing one of those materials into [...]

Individually addressable Cantilever Arrays for Parallel Atomic Force Microscopy

Sulzbach T., Engl W., Maier R., Nanoworld Services GmbH, DE

Cantilever arrays probes with self-sensing and self-actuating cantilevers and integrated sharp silicon tips for parallel surface scanning were realized. Each cantilever is equipped with a piezoresistive deflection sensor and a thermal bimorph actuator enabling an [...]

Development of the Nano Aligner for CNT-tip fabrication

Kang G-S, Lee J.S., Choi J-S, Kwak Y-K, Kim S-H, KAIST, KR

AFM tip has been used for surface profiling with a fine resolution, but there is a barrier to improve its performance because of the low aspect ratio. Many researchers have solved this problem with attaching [...]