technology CAD – TechConnect Briefs

Towards Predictive TCAD and Fab Integration

Fichtner W., Swiss Federal Institute of Technology, CH

This paper gives an overview of the status of technology computer-aided design (TCAD) as it is used today for research, development and manufacturing projects in the micro- and opto-electronics industry. While the accurate and physics-based [...]

Modeling of Stress Induced Hysteresis in Piezo-Resistive Analysis

Lien H-P, ISE, CH

The impact of mechanical stress on electrical characterizations of microelectronic circuitry is a major design issue in development of sensors and integrated micro-electro-mechanical systems. Because the electrical properties of semiconductors are in uenced by external [...]