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HomeKeywordsprocess variations

Keywords: process variations

Modeling of Mismatch and Across-Chip Variations in Compact Device Models

Lu N., IBM, US
For analog circuit designers, both reducing device mismatch and having a good device mismatch model are very important. Pelgrom characterized device mismatch between two devices separated by a finite distance D as sqrt[a^2/(W*L) + b^2*D^2]. [...]

Modeling of Spatial Correlations in Process, Device, and Circuit Variations

Lu N., IBM, US
We present an innovative method to model the spatial correlations in semiconductor process and device variations or in VLSI circuit variations. Without using the commonly adopted PCA approach, we give a very compact expression to [...]

On the Correlations Between Model Process Parameters in Statistical Modeling

Slezak J., Litschmann A., Banas S., Mlcousek R., Kejhar M., ON Semiconductor, CZ
Statistical modeling in the design of todays high performance integrated circuits (ICs) is a necessity to produce competitive products with short development time. The use of backward propagation of variance (BPV) has proven its worth [...]

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