measurements – TechConnect Briefs

Visualization of Thyroid Cancer Signs by Atomic Force Microscopy

Reshetov I.V., Chissov V.I., Sukharev S.S., Slavnova E.N., Volchenco N.N., Bykov V.A., P.A.Hertzen Moscow Research Oncological Institute, RU

Aim: Search for the AFM signs of the thyroid cancer. Instruments and Materials: AFM-system NTEGRA Prima, NT-MDT Co., Zelenograd, Russia. Cytological specimens prepared identically to those used in traditional cytological studies. Characteristics measured: the heights [...]

Evaluation of Tools for Nanoparticles-modulated Hyperthermia by Atomic Force Microscopy

Reshetov I.V., Chissov V.I., Sukharev S.S., Matorin O.V., Korizky A.V., P.A.Hertzen Moscow Research Oncological Institute (MROI), RU

Some of the properties of the medicinal forms and tools, supposed to be used as hyperthermia modulators, can be evaluated by the atomic force microscopy (AFM): sizes and concentration of nanoparticles, their capability for the [...]

A Needs-based Assessment of Measurements for Nanotechnology / Environmental Health and Safety

Allocca C.M., Campbell T., National Institute of Standards and Technology, US

The National Institute of Standards and Technology (NIST) is engaged in a continuing needs-based assessment of the state of the United States Measurement System (USMS). The USMS assessment addresses innovation-limiting measurement needs in three ways: [...]

A Model of Photoelectric Phenomena in MOS Structures at Low Electric Fields

Przewlocki H.M., Institute of Electron Technology, PL

This paper presents a new model of photoelectric phenomena taking place in MOS structures at low electric fields in the dielectric. Solutions of models equations are analyzed and discussed. Using these equations various photoelectric characteristics [...]