matching – TechConnect Briefs

All-Region MOS Model of Mismatch due to Random Dopant Placement

Klimach H., Galup-Montoro C., Schneider M.C., Universidade Federal de Santa Catarina, BR

Electron device matching has been a key factor on the performance of today’s analog or even digital electronic circuits. This paper presents a study of drain current matching in MOS transistors. A model for MOS [...]

Mismatch Improvement with XMOS Structure

Tan P.B.Y., Kordesch A.V., Sidek O., Silterra Malaysia Sdn Bhd, MY

MOS transistor has been continuously scaled down to improve the device performance. Smaller MOS transistors have higher transconductance (gm) and low capacitance, so the ratio gm/C is improved by shrinking. Shorter gate length provides higher [...]

Self-Consistent Models of DC, AC, Noise and Mismatch for the MOSFET

Galup-Montoro C., Schneider M.C., Arnaud A., Klimach H., Universidade Federal de Santa Catarina, BR

This paper shows how the full compatibility of the ACM model with the quasi-Fermi potential formulation for the drain current allows the derivation of a very simple model of the MOSFET channel. As a result, [...]