ferroelectric thin films – TechConnect Briefs

Quantification of Properties for Ferroelectric Thin Films Using Piezo-response Force Microscopy

Cain M.G., Lowe M.J., Cuenat A., Stewart M., Blackburn J., National Physical Laboratory, UK

Ferroelectric thin films are used within FE-RAM Memory devices, thermal imaging cameras and for new and emerging micro-integrated applications. Piezo Force Microscopy (PFM) is a method that can be used to probe (using a modified [...]

The Measurement of Ferroelectric Thin Films Using Piezo Force Microscopy

Cain M.G., Dunn S., Jones P., National Physical Laboratory, UK

The use of Atomic Force Microscopy to evaluated the surface properties of ferroelectric thin films is often associated with poor signal to noise ratio images and quantitative analysis is not possible. In this presentation the [...]