electrostatic force microscopy (EFM)

Charge Trapping and Charge Decay in Silicon Nanocrystals

Ng C.Y., Ding L., Chen T.P., Nanyang Technological University, SG

For applications of silicon nanocrystals in memory device, it is necessary to understand the discharging behaviors of the nanocrystals as the data endurance in memory and decay constant are important parameters to be measured. In [...]