electronics – Page 2 – TechConnect Briefs

Technologies for Deep Reductions in Military Operational Energy Use

Brown R., Sharp T., Lindsey M., Kiser S., Andrews K., Lawrence Berkeley National Laboratory, US

The U.S. Pacific Command (PACOM) has begun a research program for Transformative Reductions in Operational Energy Consumption (TROPEC), which will identify, refine and validate technologies for reducing energy use in expeditionary military outposts. The primary [...]

Benchmarking Performance and Physical Limits of Processing Electronic Device and Systems: Solid-State and Molecular Paradigms

Lyshevski S.E., Shmerko V., Yanushkevich S., Rochester Institute of Technology, US

We study physical limits and research performance estimates. The designer examines the device and system performance and capabilities using distinct performance measures, estimates, indexes and metrics. At the device level, we examine functionality, study characteristics [...]

Practical nanotechnology in Electronics

Hammer-Fritzinger D., NanoDynamics Inc., US

Nanotechnology has been hailed as the “next wave” to replace CMOS as the process of choice to make logic devices using technologies as diverse as carbon nanotube grids, polymer semiconductors and even “wetware” – ionic/electronic [...]

Application-Driven Fine Particle Solutions

Oljaca M., Atanassova P., Shen J.P., Haubrich S., Hampden Smith M., Kodas T., Cabot Corporation, US

The continuous push for performance enhancement in important existing and emerging applications has generated substantial interest in engineered fine particles. There are many examples of the improved optical, electronic, and physical properties achieved by controlling [...]

Scaling Relation for the Size Dependence of Acoustic, Dielectronic and Photonic Behaviour of Nanosolid Silicon

Sun C.Q., Pan L.K., Li C.M., School EEE, NTU, Singapore, SG

Structural miniaturization provides us with a new freedom that is indeed fascinating. The new freedom of size not only allows us to tune the physical and chemical properties of a specimen by simply adjusting the [...]