c-AFM – TechConnect Briefs

C-AFM as a means to identify heterogeneities at the nanoscale in thin anodic TiO2 films

Diamanti M.V., Souier T., Chiesa M., Pedeferri MP., Politecnico di Milano, IT

The anodic oxidation of titanium allows the obtaining of an oxide layer with thickness, color, homogeneity and insulating properties that depend on the process parameters. TiO2 thin films have been studied mostly to derive information [...]

Platinum Silicide probes: A novel approach to manufacture highly conductive AFM probes with small radii and high wear resistance

Krause O., Sebastian A., Despont M., Nanoworld Services, DE

Conventionally, conductive Atomic Force Microscopy (c-AFM) probes are either made by depositing a metal, an alloy or a doped diamond layer onto a ready-made AFM probe or, alternatively, by depositing one of those materials into [...]

Characterization of an electrical powering nano-generator based on aluminum doped ZnO thin films

Muñoz Aguirre N., Rivera López J.E., Martínez Pérez L., Tamayo Meza P., Instituto Politecnico Nacional, MX

Conductive Atomic Force Microscopy (c-AFM) [1][2] characterization was made on Aluminum doped ZnO thin films. Furthermore, to the electrical resistance associated to the surface of the film, was in series connected a load resistance as [...]