Atomic Force Microscopy (AFM) – TechConnect Briefs

Contact resistance modeling for NEMS ohmic relays using highly doped SiGe contact material

Ramezani M., Tamaddon A.H., Severi S., Vanstreels K., De Meyer K., Witvrouw A., IMEC, BE

The principal goal of this work is to develop a more accurate model for the contact resistance using the real surface profile of the contacting material in comparison to the state-of-the art where the surface [...]

Microscopic Characterization of Nanocomposite based on the Mixture of Carbon Nanotube and Rosette Nanotube

Cho J.-Y., Yamazaki T., Duque J.G., Doorn S., Das S., Green M., Fenniri H., National Institute for Nanotechnology, CA

In this paper, it was demonstrated that the self-assembled organic rosette nanotube (RNT) can encapsulate single-walled carbon nanotubes (SWNTs) and form nanocomposites. Importantly, the RNTs were found to hold their supramolecular architectures. To understand how [...]

Design of Piezoresistive Silicon Cantilevers with Stress Concentration Regions (SCR) for Scanning Probe Microscopy (SPM) Applications

Gupta A., Bashir R., Neudeck G.W., McElfresh M., Purdue University, US

This paper describes and evaluates the incorporation of novel Stress Concentration Region (SCR) in silicon based cantilevers to enhance piezoresistive displacement, force, and torque sensitivities. In brief, SCR is a region, on the cantilever, with [...]