Schaefer D.M. – TechConnect Briefs

Surface Modification of Perovskite Manganite Thin Films using Atomic Force Microscopy

Schaefer D.M., Bolling C., Sunderland J., Davidson A., Kolagaani R., Bradley T., Ludka B., Towson University, US

Nanolithography using the atomic force microscope (AFM) is emerging as a promising tool for nanotechnology . We report our results of AFM- induced nanoscale surface modifications in thin films of the CMR manganite material La0.7Ba0.3MnO3. [...]

Elastic Properties of Aspergillus nidulans Studied with Atomic Force Microscopy

Zhao L., Schaefer D.M., Xu H., Modi S., LaCourse W.R., Marten M.R., Towson University, US

An atomic force microscopy (AFM) was used as a nanoindentor to measure cell wall mechanical properties of the model fungus Aspergillus nidulans in both hyphal and spore forms. Hyphae and spores were immobilized on polylysine-coated [...]

Bio-Detection and Chemical Fingerprinting using the Inductively Coupled Plasma Mass Spectrometer (ICP-MS) Technology

Adeyinka A., Kuzmanovic D., Schaefer D.M., Lev S., Towson University, US

In this project, we explored the bioaccumulation of a large variety of inorganic trace elements in Bacillus subtilis using an inductively coupled plasma mass spectrometer and compared it to other related and unrelated species. Bacillus [...]