Li C.M. – TechConnect Briefs

Impedance Characterization of Dielectric and Semiconducting Materials with Organic Capacitors for Organic Transistors

Li C.M., Pan L.K., Sun C.Q., Zhang J., Gamota D., Nanyang Technological University, SG

Characterization of the properties of OFET materials and devices have been conducted by I-V or C-V curves that used in MOS devices for provide information of basic shape, threshold voltage, mobility effects, velocity saturation, scaling, [...]

Scaling Relation for the Size Dependence of Acoustic, Dielectronic and Photonic Behaviour of Nanosolid Silicon

Sun C.Q., Pan L.K., Li C.M., School EEE, NTU, Singapore, SG

Structural miniaturization provides us with a new freedom that is indeed fascinating. The new freedom of size not only allows us to tune the physical and chemical properties of a specimen by simply adjusting the [...]