SPICE Modeling of Multiple Correlated Electrical Effects of Dopant Fluctuations
Lee Y.M., Watts J., Grundon S., Cook D., Howard J., IBM Semiconductor Research and Developement Center, US
We proposed a new methodology capable of accurately modeling the partial correlations and geometric dependency in the local random fluctuations of various electrical parameters. This method incorporates principal factor analysis (PFA) into the conventional SPICE-based [...]