Gorshkov O.N. – TechConnect Briefs

Imaging and Spectroscopy of the Au Nanoclusters in the YSZ Films by Ballistic Electron/Hole Emission Microscopy

Filatov D.O., Guseinov D.V., Antonov I.A., Gorshkov O.N., Bobrov A.I., Pavlov D.A., N.I.Lobachevskii University of Nizhny Novgorod, RU

We report on the first time application of Ballistic Electron/Hole Emission Microscopy (BEEM/BHEM) to imaging and spectroscopy of metal NCs in the ultrathin dielectric films. We studied the yttria stabilized zirconia (YSZ) films (12% mol. [...]

SPM Investigation of the Electron Properties YSZ Nanostructured Films

Antonov D.A., Gorshkov O.N., Kasatkin A.P., Maximov G.A., Saveliev D.A., Filatov D.O., University of Nizhny Novgorod, RU

In present work, the electron properties of YSZ nanostructured films using combined Atomic Force Microscopy / Òunnel Spectroscopy (AFMTS) have been investigated.It was demonstrated, the implantation of the films ZrO2(Y) by zirconium ions reduced forming [...]