Physical properties of multilayer thin films of Ti-V and their hydrides studied by ion beam analysis methods
Drogowska K., Flege S., Becker H.-W., Tarnawski Z., Zakrzewska K., Balogh A.G., AGH University of Science and Technology, PL
A wide variety of characterization techniques were used to determine the properties of titanium, titanium oxides and vanadium oxide thin film multilayers with different thicknesses, for the as-deposited state as well as under different levels [...]