Fast, robust and simple all optical far-field nano-positioning measurements
Juan M.L., Tischler N., Fernandez-Corbaton I., Zambrana-Puyalto X., Vidal X., Molina-Terriza G., QISS, AU
We present a novel method for the nano-positioning measurement of a sample relying on symmetry considerations. In particular, we exploit the cylindrical symmetry of a control defect appended to the sample. The exact nature of [...]