Cain M.G. – TechConnect Briefs

Europe’s First Institute of Piezoelectric Materials & Devices

Cain M.G., National Physical Laboratory, UK

The European ‘Multifunctional Integrated Devices’ Network of Excellence is taking piezoelectric technologies into the industrial mainstream. It has successfully created the European Institute of Piezoelectric Materials and Devices with a founding membership of multidisciplinary researchers [...]

Influences of the Surrounding Materials on CdTe Quantum Dots within Self-Assembled Thin Films

Gardner H.C., Bertoni C., Gallardo D.E., Dunn S., Cain M.G., National Physical Laboratory, UK

Semiconductor nanocrystals (NCs) have been successfully incorporated into nanostructured light emitting devices (NLEDs) and now promise applications in electronic, medical and telecommunication industries. To better understand and further develop NLEDs it is important to consider [...]

Characterisation of thin film piezoelectric materials by differential interferometric techniques

Cain M.G., Steward M., Downs M., National Physical Laboratory, UK

Piezoelectric thin films are considered emergent materials for integration within Micro Systems Technology (MST) or MEMS devices. The development of suitable measurement facilities to characterise the materials functional properties is complicated by the fact that [...]

Quantification of Properties for Ferroelectric Thin Films Using Piezo-response Force Microscopy

Cain M.G., Lowe M.J., Cuenat A., Stewart M., Blackburn J., National Physical Laboratory, UK

Ferroelectric thin films are used within FE-RAM Memory devices, thermal imaging cameras and for new and emerging micro-integrated applications. Piezo Force Microscopy (PFM) is a method that can be used to probe (using a modified [...]

The Measurement of Ferroelectric Thin Films Using Piezo Force Microscopy

Cain M.G., Dunn S., Jones P., National Physical Laboratory, UK

The use of Atomic Force Microscopy to evaluated the surface properties of ferroelectric thin films is often associated with poor signal to noise ratio images and quantitative analysis is not possible. In this presentation the [...]