A Novel Near Infra-Red Fluorescent Probes to Repair Metal Artifact After Implantation
Chang W.H., Chiu L-H, Kung F.-C., Lai W.-F.T., Tsai Y-H, Yang M.-C., Taipei Medical University, Harvard Medical School/McLean Hospital, TW
Accurate, noninvasive techniques for monitoring bone-implant integration are demanded in clinic. Standard X-ray and CT provide a snapshot of the skeletal structure. However, metal artifact is an unsolved problem to visualize the CT image detail [...]