RU – Page 10 – TechConnect Briefs

Nanocrater Formation via Coulomb Explosion Initiated by Impingement of Highly Charged Xenon Ions with Silicon Surface

Valuev A.A., Terasawa M., Sekioka T., Insepov Z., Yamada I., Moscow Institute of Physics and Technology, RU

The aim of this work is to study the dynamics of nanocrater formation induced by Coulomb explosion. The Molecular Dynamics (MD) method is used with realistic interaction potentials. The time and space distribution of density, [...]

Inverse Modeling for C-V Profiling of Modulated-Doped Semiconductor Structures

Kokorev M.F., Maleev N.A., Pakhnin D.V., State Electrotechnical University, RU

Inverse modeling is a way for the verification of device models and for the parameter extraction. A technique of doping profile extraction of semiconductor structures based on the capacitance-voltage measurements (or C-V profiling) is used [...]

Investigation of Interaction Between Subparts in Human Hemoglobin Using Concept of Conjugated Ion-Hydrogen Bonds Systems and Its Application to Biosensors Development Problem

Luchinin V.V., Demchenko E.L., Karasev V.A., St. Petersburg State Electrotechnical University, RU

The novel concept of conjugated ion-hydrogen bonds system as the basic charge-,energy- and siganl-transferring structure on the proteins, proposed by authors in previous publications, is demonstrated with the help of a new compueter program, developed [...]

Spice-like Simulation Using Real Devices Instead of their Mathematical Models

Denisenko V.V., Research Laboratory of Design Automation, RU

Modern Spice-like circuit simulators use increasingly accurate and sophisticated analytical models of components. But the validity of models, that is the probability that the procedure of the model verification is true, still remains very poor. [...]