Rodriguez B.J., Jesse S., Baddorf A.P., Kalinin S.V., Gruverman A.
Oak Ridge National Laboratory, US
Keywords: AFAM, AFM, PFM, piezoelectric force microscopy
This is a detailed examination of the electro-mechanical and elastic coupling that occurs in the scanning probe microscopy of electro-active materials. This research is useful to detecting, imaging and understanding the orientation of nanoscale electromechanical anisotropies in material. This method has been applied to piezo electric and ferro electric thin films as well as biological samples
Journal: TechConnect Briefs
Volume: 2, Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
Published: May 8, 2005
Pages: 667 - 670
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 0-9767985-1-4