Ramminger S., Mitic G., Türkes P., Wachutka G.
Siemens AG, DE
Keywords: failure analysis, IGBT, power electronics, reliability, thermo-mechanical simulation, wire bonding
High voltage and high current power modules are key components for traction applications. In the future, railway locomotives, tramways and elevators will be equipped with Insulated Gate Bipolar Transistor (IGBT) modules. In this field of application high reliability is of decisive importance, especially for aluminum bond wires with diameters up to 500 µm, connecting the silicon device with the output pins. Reliability tests show that wire bonding and soldering may cause failures of the modules. In this work, we investigate the stress and strain distributions in the bonding zone after a temperature load step using finite-element analysis.
Journal: TechConnect Briefs
Volume: Technical Proceedings of the 1999 International Conference on Modeling and Simulation of Microsystems
Published: April 19, 1999
Pages: 483 - 486
Industry sector: Sensors, MEMS, Electronics
Topic: Modeling & Simulation of Microsystems
ISBN: 0-9666135-4-6