Papers – Page 79 – TechConnect Briefs

In-situ Surface Characterization of Nano- and Microparticles by Optical Second Harmonic Generation

Schürer B., Wunderlich S., Peschel U., Peukert W., University of Erlangen-Nuremberg, DE

We use optical Second Harmonic Generation (SHG) to probe different kinds of surface properties of dispersed particle systems in in-situ and in real time. Examples for applications are the direct study of molecular adsorption at [...]

Atomic scale dopant detection in an individual silicon nanowire by atom probe tomography

Chen W-H, Lardé R., Cadel E., Xu T., Grandidier B., Nys J.P., Pareige P., Groupe de Physique des Matériaux, FR

The atom probe tomography is a three-dimensional high resolution analytical microscope that can map the distribution of atoms in semiconductor materials such as silicon nanowires.

Advances in Helium Ion Microscopy for High Resolution Imaging and Material Modification

Thompson W., Notte J., Scipioni L., Ananth M., Stern L., Sijbrandij S., Sanford C., Carl Zeiss SMT, US

The helium ion microscope routinely obtains sub-nanometer resolution on uncoated soft materials with a high signal to damage ratio. In addition to its high resolution imaging capability, the microscope has been successful at sub-nanometer film [...]

Individual SiGe Nanowire Chemical Composition Depth Profiling and Surface Oxidation Analyzed by Auger Electron Spectroscopy

Hammond J.S., Givan U., Paul D., Patolsky F., Physical Electronics USA, US

The lateral and depth distributions of the surface oxidation and the surface Phosphorous doping concentrations have been measured from an individual SixGe(1-x) 60 nm diameter nanowire with Auger Electron Spectroscopy combined with sputter ion depth [...]

Imaging three-dimensional microstructures fabricated by two-photon polymerization using CARS microscopy

Baldacchini T., Newport Corporation, US

Two-photon polymerization (TPP) is an enabling technology that allows fast prototyping of parts with sub-100 nm resolution. Due to its ability to fabricate microstructures with arbitrary three-dimensional geometries, TPP has been employed in diverse fields [...]

Mechanical Characterization of Metallic Nanowires by Combining Atomic Force Microscope (AFM) and Scanning Electron Microscope (SEM)

Celik E., Madenci E., The University of Arizona, US

Mechanical characterization of nanowires still poses challenges due to their small length scale. Existing nanowire mechanical characterization techniques in literature can be grouped as: 1) resonation of nanowires in an electron microscope, 2) mechanical characterization [...]

Subsurface characterization of high dielectric nanostructures in low dielectric polymer matrix using Electric Force Microscopy and Scanning Electron Microscopy

Zhao M., Ming B., Stutzman P., Chen G., Gu X., Park C., Jean Y.C., Nguyen T., National Institute of Standards and Technology, US

Scanning Probe Microscopy (SPM) and Scanning Electron Microscopy (SEM) are two powerful techniques for surface characterization of nanostructures. With the development of nanotechnology, there is a growing need to nondestructively characterize nanostructures at the subsurface [...]

Nanoscale Chemical Spectroscopy with the Atomic Force Microscope

Prater C.B., Cook D., Shetty R., Kjoller K., Anasys Instruments, US

The ability to unambiguously identify arbitrary material under the tip of an AFM has been identified as one of the “Holy Grails” of probe microscopy. While the AFM has the ability to measure mechanical, electrical, [...]

Advanced nanoscale elastic property measurement by contact-resonance atomic force microscopy

Stan G., Cook R.F., National Institute of Standards and Technology, US

In the past few years, we have improved and developed the capabilities of CR-AFM in various ways: established clear criteria for assessing the precision and accuracy in CR-AFM measurements, introduced a load-dependent CR-AFM protocol suitable [...]