Modeling & Simulation of Microsystems – Page 6

Magnetic Nanoparticle Dynamics and Assembly Phenomena in External Magnetic Fields

Xue X., Furlani E.P., SUNY-Buffalo, US

The interest in magnetic nanoparticles and ferrofluids has grown substantially in recent years as their applications continue to proliferate. Current applications are diverse and include the transport of biomolecules and therapeutic drugs [1], gene transfection [...]

Secondary Microflows in Electrokinetic Transport with Hydrodynamic Slippage Effect

Kim K.S., Chun M.-S., Byun Y.T., Woo D.H., Korea Institute of Science and Technology (KIST), KR

The curved microchannel is frequently encountered in the lab-on-chips because it provides a convenient way for increasing channel length per unit area. The behavior of electrokinetic flow with curvature-induced secondary motion was explored based on [...]

Evanescent wave-based particle tracking technique for velocity distribution in extended nanochannel

Kazoe Y., Iseki K., Mawatari K., Kitamori T., The University of Tokyo, JP

We developed a flow measurement technique of velocity distribution in extended nanochannel (10- 1000 nm), using fluorescent tracer nanoparticles and the evanescent wave which penetrates into a liquid medium with an exponential decay from the [...]

Micro & Nano Fluidics

Impact of Channel Length and Gate Width of a N-MOSFET Device on the Threshold Voltage and its Fluctuations in Presence of Random Channel Dopants and Random Interface Trap: A 3D Ensemble Monte Carlo Stud

Ashraf N., Joshi S., Vasileska D., ASU, US

Previously we have reported threshold voltage fluctuations caused by presence of random distribution of dopant ions in the channel region of a 45 nm n-MOSFET and random single interface trap positioned from source to drain [...]

Experimental analysis of the MEMS Capacitive accelerometer’s shock resistibility

Tao Y., Liu Y., Dong J., Tsinghua University, CN

The shock resistibility of MEMS device has been an urgent issue in the field of consumer electronics, automotive industry and special military applications. The paper analyses experimentally the shock resistibility of a typical MEMS capacitive [...]

Detecting Defects over the Whole Surface of Wafer by Non-destructive and Non-contact Pulse Photoconductivity Method (PPCM)

Ndagijimana J., Soh Y., Kubota H., Kobayashi K., Kumamoto University, JP

With the miniaturization of CMOS, the gate insulator has extremely become thin until reaching the EOT (equivalent oxide thickness) of less than 1nm in order to keep maintaining high-speed performances of devices and low electric [...]

Reliability Prediction of Single-Crystal Silicon MEMS Using Dynamic Raman Spectroscopy

Dewanto R., Hu Z., Gallacher B., Hedley J., Newcastle University, UK

This paper proposes an extension and improvement to reliability predictions in single-crystal silicon MEMS by utilizing dynamic Raman spectroscopy to allow the gathering process of Weibull fracture test data to be done directly on devices [...]

Nanoscale deformation analysis for fracture mechanical evaluation of interface cracks in electronic packages

Keller J., Schulz M., Mrossko R., Wunderle B., Michel B., AMIC Angwandte Micro-Messtechnik GmbH, DE

The ongoing development of highly integrated electronic packages leads to a steadily increasing number of material interfaces within a package. In combination with increasing harshness (vibration, humidity, temperature) of the system environment the reliability of [...]

Shock Testing of Free Standing Silicon-Nitride and Beryllium Membranes

Brough D., Barrett L., Vanfleet R., Davis R., Liddiard S., Cornaby S., Coffin M., Brigham Young University, US

As micro and nanotechnology continue to advice into products, durability, reliability and robustness become important factors. One application where micro technology needs such qualities is X-ray windows. X-ray windows consist of free standing thin film [...]