Heying M., Oliver J., Sundararajan S., Shrotryia P., Zou Q., Sannier A.
Iowa State University, US
Keywords: Atomic force microscope, scanning probe microscope, simulation
Virtual Probe Microscope (VPM) is a tool that has been developed to train users on Atomic Force Microscope (AFM) operation. The benefits from training with VPM include: reduced cost of training and increased transfer of training. The graphical user interface of VPM is layed out similar to common commercial AFM software packages. Along with standard AFM controls, users are given an additional graphical 3D window to view the probe traversing across a surface. Users are also allowed to manipulate probe geometry variable to increase understanding of AFM operation. VPM will be used in a graduate level scanning probe microscopy class in the spring of 2005 at Iowa State University to supplement traditional lab and classroom instruction.
Journal: TechConnect Briefs
Volume: 2, Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
Published: May 8, 2005
Pages: 753 - 756
Industry sector: Advanced Materials & Manufacturing
Topic: Advanced Manufacturing
ISBN: 0-9767985-1-4