Towards an Integrated Environment for Modeling and Simulating an Electro-Optic Measurement Microsystem

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The problem of tools for modeling simulating and testing measurement microsystems is addressed. The design methodology underlying the proposed integrated software & hardware environment for modeling and simulating measurement microsystems is based on functional simulation of the whole system and on step-by-step replacement of the simulated blocks of the designed system by real ones. The environment allows for modeling, simulatin,,, and testing different combinations of the optical transducers and dedicated electrical processors in order to arrive at overall optimization of the measurement microsystem under development: an integrated spectrometric sensor in our case. Examples of application of the environment for optimization of effciency of the digital signal processing in the integrated spectrometric sensor under development are shown.

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Journal: TechConnect Briefs
Volume: Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems
Published: April 6, 1998
Pages: 619 - 624
Industry sector: Sensors, MEMS, Electronics
Topics: MEMS & NEMS Devices, Modeling & Applications, Photonic Materials & Devices
ISBN: 0-96661-35-0-3