In this article is proposal a design of logical elements “AND”/”OR” based on punch-through effect with a deformation (element ”AND”) of space charge regions (SCR). I.On the substrate N- type is formed P+ – bodies 1 – injector and 2 – operating elements. By supplying negative voltage equal punch-through voltage (Upt) on one element 2 is occurred punch-through SCRs into P+-N-P+ – structure (injector1 through load resistor is grounded terminal). After punch-through in the device is appeared through current and on the load resistor is assigned a signal. The same process is repeated with other operating element – 2. We have logic operation “AND”. The length d1 is defined from two conditions: d1 2[2eeo(jc + Upt)/qNd]1/2 In this case operating signals elements –2 do not interaction between itself. II.Lengths d1 and d2 are changed in logical element “OR”: d1> d2; d2 d2. By applying two negative operating signals simultaneously is happened punch – off process (like in JFET between top and bottom gates) between elements – 2 and so d1> d2 beginning displacement their space charge regions, both SCRs get the SCR of injector-substrate p-n – junction. The punch-through process gets beginning and on load resistor is allocated a signal. The logical element “OR” is done.
Journal: TechConnect Briefs
Volume: 3, Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 3
Published: May 20, 2007
Pages: 209 - 212
Industry sector: Sensors, MEMS, Electronics
Topics: Sensors - Chemical, Physical & Bio