Alghamdi H., Concepcion B., Baliga S., Misra P.
Howard University, US
Keywords: FTIR spectroscopy, molecular dynamics simulation, Raman spectroscopy, SEM, tin dioxide, x-ray diffraction
Thin films and powder samples of tetragonal tin dioxide (SnO2) on UV quartz and silicon wafers, created through radio frequency (RF) sputtering in an oxygen/argon mixed atmosphere, have been prepared and characterized spectroscopically. These thin films, along with SnO2 powder samples, were analyzed using a variety of different spectroscopic techniques, including Raman spectroscopy, X-ray diffraction (XRD), Fourier Transform Infrared (FTIR) spectroscopy, and Scanning Electron Microscopy (SEM). The spectral results have been compiled and analyzed in conjunction with a Molecular Dynamics simulation effort to model the vibrational modes of SnO2. The primary goal of the project has been to compare the results of both experimental and computational approaches to detect spectral features that have not previously been recognized and predict potential uses of these vibrational features for gas-sensing technology.
Journal: TechConnect Briefs
Volume: TechConnect Briefs 2021
Published: October 18, 2021
Pages: 69 - 70
Industry sector: Advanced Materials & Manufacturing
Topics: Advanced Materials for Engineering Applications, Materials Characterization & Imaging
ISBN: 978-0-578-99550-2