Solid Modeling of Nanoscale Artifacts

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Solid modeling involves creation and manipulation of complete and unambiguous mathematical representations of 3-D objects. The purpose of such representation is to provide tools for visualization, calculation of geometric properties and realization by design and manufacturing processes. Existing methods of solid modeling can be classified into one of the three major categories: constructive solid geometry (CSG), boundary representation (B-rep) and decomposition methods. When it comes to representing artifacts at a nanoscale, these representations are inadequate as they do not account for arrangement of individual atoms and molecules in the form of a lattice structure, lattice planes, lattice constants etc. Moreover, the nano-fabrication processes are very different from conventional manufacturing processes and calls for finding newer representations and modeling schemes suitable for realization nanoscale objects. With this in mind we propose a new solid modeling scheme for nano artifacts. It is felt that this will bridge a gap in the area of nanotechnology as to the best of authors knowledge there have no such attempts in the past. One of the major challenges in solid modeling nano-scale objects is their non-uniqueness, even when the size and shape of objects is fixed. This is because the nano-scale artifacts can not be uniquely defined without taking into account their crystalline structure, orientation of lattice planes and lattice constants. The need for modeling nano-artifacts accounting for these requirements was also felt during manufacturing of these by processes such as scanning tunneling microscopy. A new solid modeling scheme is proposed which can account for these additional requirements of nano-scale objects. The proposed scheme is very different from existing solid modeling schemes and its applicability and effectiveness is demonstrated by taking many examples including devices such as nanotubes. Further, construction of solid models of nanoscale objects using proposed modeling scheme is discussed.

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Journal: TechConnect Briefs
Volume: 3, Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 3
Published: March 7, 2004
Pages: 103 - 106
Industry sector: Advanced Materials & Manufacturing
Topic: Informatics, Modeling & Simulation
ISBN: 0-9728422-9-2