Slezak J., Litschmann A., Banas S., Mlcousek R., Kejhar M.
ON Semiconductor, CZ
Keywords: corner analysis, Monte Carlo, process variations, statistical correlations, statistical modeling
Statistical modeling in the design of todays high performance integrated circuits (ICs) is a necessity to produce competitive products with short development time. The use of backward propagation of variance (BPV) has proven its worth among other approaches proposed for the statistical modeling. This methodology introduces physically based process and geometry-dependent parameters (PGPs) for each device that is available to the design community in a model library. The goal of this contribution is to propose a simple method to establish mathematical relationships among correlated PGPs.
Journal: TechConnect Briefs
Volume: 2, Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 2
Published: March 7, 2004
Pages: 144 - 146
Industry sector: Sensors, MEMS, Electronics
Topic: Compact Modeling
ISBN: 0-9728422-8-4