Wang S., Lau S.H., Tkachuk A., Druewer F., Chang H., Feser M., Yun W.
Xradia, Inc., US
Keywords: micro-CT, nano-CT, tomogrpahy, X-ray microscopy
X-ray microscopy offers a unique combination of large penetration depth, high resolution, and high sensitivity to elemental composition. When combined with computed tomography (CT) techniques, the full three-dimensional structure of a sample can be obtained non-destructively and often with little sample preparation. With Xradia’s high-resolution x-ray optics technology, we have pushed the imaging resolution to 40 nm in our nanoXCT system. This product has been applied to a wide range of applications including single-cell level biological microscopy, failure analysis of state-of-the-art semiconductor integrated circuits, and fuel cell development. By further integrating this high-resolution x-ray imaging system with a projection-type x-ray micro-CT system, we have developed a multi-scale x-ray CT system with variable resolution between 40 nm to 40 m, and field of view from 40 m to 40 mm. This system offers unprecedented non-destructive imaging capabilities for structures ranging from tens of nm to tens of m size scale – a “zoom” range of 1,000. Our presentation will be focused on unique capabilities provided by this novel instruments and its applications.
Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2008: Materials, Fabrication, Particles, and Characterization – Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, Volume 1
Published: June 1, 2008
Pages: 822 - 825
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4200-8503-7