We propose a more robust and design-adaptive nanofabric crossbar PLA architecture and associated test methodology to enance the yield and minimize the time complexity for configuration. It is tested for different sizes and defect rate combinations to compute the overall gain in terms of time complexity.
Journal: TechConnect Briefs
Volume: 1, Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 1
Published: May 20, 2007
Pages: 162 - 165
Industry sectors: Advanced Materials & Manufacturing | Sensors, MEMS, Electronics
Topicss: Nanoelectronics, Photonic Materials & Devices