Yassar R.S., Yap Y.K.
Michigan Technological University, US
Keywords: AFM, in-situ, nanotube, STM, TEM
One-dimensional nanomaterials including nanotubes are building blocks for constructing various complex nanodevices. Boron nitride (BN) nanotubes with structure similar to carbon nanotube are known to be among the strongest insulators in the world. In this work, deformation of an individual BN nanotube is performed inside a high-resolution transmission electron microscope (TEM) using a piezo-driven atomic force microscope (AFM) and scanning tunneling microscope (STM)–TEM holder. The electrical and mechanical properties of individual BN nanotubes are obtained from the experimentally recorded I-V and force-displacement curves.
Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics
Published: May 3, 2009
Pages: 318 - 322
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4398-1782-7