This paper will describe the ways in which one can use impedance and dielectric spectroscopy for characterizing nanoparticulate thin films and composites. This technique is especially useful for these types of materials because it is sensitive to the many interfaces present. Talk will focus on the expected trends for different types of nanomaterials and end with examples from the author’s recent works.
Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites (Volume 1)
Published: May 12, 2013
Pages: 167 - 170
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging