Balantekin M.
Izmir Institute of Technology, TR
Keywords: noncontact atomic force microscopy
In this study, we present a new operating method that we developed to be used in noncontact atomic force microscopes. This method is developed to minimize the time spent for noncontact AFM imaging experiments. In addition, the real-time imaging without complex AFM systems will be possible with this operating method. We will first describe the method and present our initial simulation results showing that even with a typical AFM cantilever 15 frames/second imaging speed can be easily achieved.
Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites (Volume 1)
Published: May 12, 2013
Pages: 1 - 4
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4822-0581-7