Lin C-M, Yu T.-C., Lai S.H., Ho H.C., Weng H.F., Wang S-H., Chen C-J.
Center for Measurement Standards, Industrial Technology Research Institute, TW
Keywords: differential mobility analysis, measurement uncertainty, nanoparticle size
This paper presents the measurement results and the uncertainty analysis for four batches of polystyrene latex (PSL) spheres with nominal sizes of 20 nm, 100 nm, 300 nm and 500 nm using the measurement system which differential mobility analysis (DMA) method is applied. The possible error sources are evaluated based on the DMA method and the measurement procedures. The resulting expanded uncertainties are 1.3 nm for the 20 nm particles and 13 nm for the 500 nm particles at 95% confidence interval.
Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites
Published: June 21, 2010
Pages: 160 - 163
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4398-3401-5