Dhar R.S., Ban D.
University of Waterloo, CA
Keywords: atomic force microscopy, nanoscopic probing, quantum cascade laser, scanning voltage microcopy
A nanoscopic probing technique to measure voltage drop across an operating device in cryogenic temperature condition has been developed and established. The cross section surface of the terahertz (THz) quantum cascade laser (QCL) was profiled to resolve the voltage variation.
Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2014: Graphene, CNTs, Particles, Films & Composites
Published: June 15, 2014
Pages: 428 - 431
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4822-5826-4