Comparison of carbon nanotube data collected using two microscopy methods: dark-field hyperspectral imaging and electron microscopy


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Currently, the National Institute for Occupational Safety and Health (NIOSH) Nanotechnology Research Center uses a modified version of the NIOSH Manual of Analytical Method 7303 (Elements by ICP) and electron microscopy (either scanning or transmission) on filter-based field samples to identify and confirm the presence, quantity, size, and degree of agglomeration of nanomaterials. Analysis of electron microscopy samples can be quite costly and can take an extended period of time to complete. The Nanotechnology Research Center has been exploring the potential for using dark-field hyperspectral microscopy to identify the presence and size of nanomaterials. This method has the potential for use as a “screening” method prior to or instead of electron microscopy.

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Journal: TechConnect Briefs
Volume: 1, Advanced Materials: TechConnect Briefs 2015
Published: June 14, 2015
Pages: 5 - 8
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4987-4727-1