AM-­FM and Loss Tangent Imaging-Two New Tools for Quantitative Nanomechanical Properties

Proksch R., Revenko I., Hohlbach S., Cleveland J., Geisse N., Moshar A., Bemis J., Callahan C.
Asylum Research, US

Keywords: AM-FM, materials characterization

see attached abstract

PDF of paper:

Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2012: Advanced Materials, CNTs, Particles, Films and Composites (Volume 1)
Published: June 18, 2012
Pages: 27 - 30
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4665-6274-5