stiffness calibration – TechConnect Briefs

A New High Precision Procedure for AFM Probe Spring Constant Measurement using a Microfabricated Calibrated Reference Cantilever Array (CRCA)

Reitsma M.G., Gates R.S., National Institute of Standards and Technology, US

A new technique for calibrating Atomic Force Microscope (AFM) cantilevers is demonstrated using a unique array of microfabricated reference cantilevers. The array, consisting of seven uniform rectangular cantilevers of different length (and thus stiffness), was [...]

New reference standards and artifacts for nanoscale property characterization

Pratt J.R., Kramar J.A., Shaw G., Gates R., Rice P., Moreland J., National Institute of Standards and Technology, US

This paper provides an overview of calibration artifacts being developed at NIST that will greatly aid the accurate determination of nanoscale physical properties across a broad range of applications. We focus on three proposed reference [...]