SPM – TechConnect Briefs

Magnetic Resonance Force Microscopy using a Commercially Available SPM Unit

Won S., Heo J., Korea Institute of Materials Science, KR

Magnetic resonance force microscopy (MRFM) is considered another as a novel scanning probe microscope (SPM) combined with conventional SPM and magnetic resonance imaging. Originally, MRFM is proposed as a means to improve detection sensitivity to [...]

Nanoscale SPM Characterisation of Nacre Argonite Plates and Synthetic Human Amyloid Fibres

Grishin I., Tinker C., Allsop D., Robson A., Kolosov O.V., Lancaster University, UK

Nacre exhibits structural robustness despite the brittle nature of its constituents. A detailed understanding of its fabrication principles developed in nature can lead to new ideas in material design and synthesis. But due to this [...]

Adhesion and dynamic nanotribology of graphene in polar and non-polar liquid environments studied with ultrasonic force microscopy

Robinson B.J., Kolosov O.V., Lancaster University, UK

We report the characterisation of exfoliated few layer graphene (FLG) flakes using a range of scanning probe techniques. We have examined the nanoscale mechanical and interfacial properties of FLG and its substrate material, SiO2, in [...]

Direct nanoscale 3D characterisation of Ge-Sb-Te and Ge-Te phase change films

Grishin I., Kolosov O.V., Lancaster University, UK

DC magnetron sputter-deposited Ge-Sb-Te and Ge-Te based phase change thin films were investigated via a variety of Scanning Probe Microscopy techniques. Micron and sub-micron crystalline and amorphous bit patterns were induced with laser heating and [...]

Subsurface characterization of high dielectric nanostructures in low dielectric polymer matrix using Electric Force Microscopy and Scanning Electron Microscopy

Zhao M., Ming B., Stutzman P., Chen G., Gu X., Park C., Jean Y.C., Nguyen T., National Institute of Standards and Technology, US

Scanning Probe Microscopy (SPM) and Scanning Electron Microscopy (SEM) are two powerful techniques for surface characterization of nanostructures. With the development of nanotechnology, there is a growing need to nondestructively characterize nanostructures at the subsurface [...]

Atomic Force/Scanning Probe Microscopy of Pharmaceutical and Biological Materials

Chernoff D.A., Advanced Surface Microscopy, Inc., US

AFM is a valuable tool for a wide range of materials and device analysis. AFM images of particles and biopolymers are valued because direct visualization and measurement of individual objects complements the average measures obtained [...]

Commercially Available High-Throughput Dip Pen Nanolithography®

Haaheim J., Nafday O., Fragala J., Shile R., Val V., NanoInk, US

We present methods and applications of the commercially available 2D nano PrintArray(TM), which provides massive scalability for dip pen nanolithography. We will discuss current applications and future development.

Characterisation of Electrical Fields of Buried Interdigitated Nanoscale Ti-Electrode Arrays by a Novel Atomic Force Microscopy Measurement Procedure and Their Fabrication by FIB Milling

Jenke M.G., Santschi Ch., Hoffmann P., EPFL (Ecole Polytechnique Fédérale de Lausanne), CH

The fabrication and characterisation of interdigitated titanium nanoelectrode arrays with 500nm and 50nm width and spacing is described in this work. The electrical-field above the fabricated 500nm electrodes can be sensed by means of a [...]

Highly sensitive Scanning Capacitance Microscope

Tanbakuchi H., Agilent Technologies, US

Summary—Emerging nanotechnology and biotechnology are in direct need of metrology tools with better than 10 –nm spatial resolution that are capable of imaging surfaces and nanoembeded structures. Scanning local probe microscopy (SLPM) techniques have advanced [...]

Compact Electromagnetic XY Stage with Nano Scale Resolution and Vibration Resistance

Lee K-I., Kim S-H, Cho J-W, Choi Y.J., Shin J-K, Yoo J.C., Choi Y.J., Korea Electronics Technology Institute, KR

The design, fabrication, and the measurement results of an electromagnetic XY stage are presented. The device has an anti vibration structure and shows a high fill factor of 45% due to its unique structure. Furthermore, [...]