A Unified Process-Based Compact Model for Scaled PD/SOI and Bulk-Si MOSFETs
A process/physics-based compact model (UFPDB), unified for PD/SOI and bulk-Si MOSFETs with a single small set of parameters, is overviewed. The utility of UFPDB, e.g., for benchmarking PD/SOI and bulk-Si CMOS and for projecting performances [...]