Advancements in Microelectronics-Grade Carbon Nanotube Materials for NRAM® Device Manufacture and Analysis of Carbon Nanotube Mass in End User Devices
Lamb J.E., Gibbons S., Trichur R., Jiang Y., Mangelson K., Kremer K., Janzen D., Brewer Science, Inc, US
Providing materials for use in semiconductor manufacturing is challenging due to the extreme quality levels required for low metal ion and defect levels. This challenge is much greater for suppliers of materials containing long, high-aspect-ratio [...]