Nano-bending Method to Identify the Residual Stresses of MEMS Films
Kim J.G., Kim J.H., Kim Y.H., Kim J.G., Kim J.H., Kim Y.H., Hahn J.H., Lee H.Y., Kim J.G., Kim J.H., Kim Y.H., Seoul National University, KR
Surface micro-machined MEMS frequently suffer from the residual stress which might significantly decrease the performance and reliability of micro devices. It is important to accurately measure the residual stresses at manufacturing step. The Stoney’s equation [...]