Update on evaluation of enhanced darkfield microscopy and hyperspectral mapping for analysis of airborne nanoparticulate collected on filter-based media
Neu-Baker N.M., Eastlake A., Brenner S.A., State University of New York Polytechnic Institute, College of Nanoscale Science, US
Current best-known methods for engineered nanomaterial (ENM) exposure assessment in occupational environments include the capture of airborne ENMs onto filter media.1–3 The current standard method for the analysis of filter media is direct visualization via [...]