Theoretical Studies in Epitaxial Stabilization of ZnO-based Light-emitting Semiconductors
The device quality ZnO films are expected to next generation materials applied in the field of photo-electronic devices. We find that (0001)-oriented ZnO, Zn0.875Be0.125O, Zn0.875Mg0.125O, and Zn0.875Al0.125O strained layer lattices soften as lattice parameter of [...]