Xu R. – TechConnect Briefs

Nanoparticle characterization using light scattering technologies

Xu R., Beckman Coulter, Inc., US

To size smaller particles, dynamic light scattering (DLS) that utilizes time variation of scattered light from suspended particles to obtain their hydrodynamic size distribution is the most popular technology. For measuring turbid samples with particle [...]

Characterization of Microscale Material Behavior with MEMS Resonators

White C.D., Xu R., Sun X., Komvopoulos K., University of California-Berkeley, US

The reliability of MEMS devices greatly depends on precise characterization of material behavior at the micron scale. This paper presents a novel material characterization device for fatigue testing. The fatigue specimen is subjected to multi-axial [...]