Wu Y-L – TechConnect Briefs

Observation of Soft-Breakdown in Ultra-Thin SiO2 Films under Repetitive Ramped Voltage Stress by Using Conductive Atomic Force Microscopy

Wu Y-L, Lin S-T, Liao J-C, National Chi-Nan University, TW

The degradation and breakdown characteristics of ultra-thin SiO2 (Tox = 5 nm) were investigated by using conductive AFM (C-AFM). Repetitive ramped voltage stress (RVS) was applied through the C-AFM tip to the oxide with polarity [...]

An Improved Single-Electron-Transistor Model for SPICE Application

Wu Y-L, Lin S-T, National Chi-Nan University, TW

Single electron transistors (SETs) have drawn much attention of researchers and scientists because they are considered candidate as one of the elements for future low power, high-density memories and logic circuits. Instead of using Monte [...]