Surface Modification of Perovskite Manganite Thin Films using Atomic Force Microscopy
Schaefer D.M., Bolling C., Sunderland J., Davidson A., Kolagaani R., Bradley T., Ludka B., Towson University, US
Nanolithography using the atomic force microscope (AFM) is emerging as a promising tool for nanotechnology . We report our results of AFM- induced nanoscale surface modifications in thin films of the CMR manganite material La0.7Ba0.3MnO3. [...]